FIB pre-tilt holders

EM-Tec FIB pre-tilt stub holders

EM-Tec FIB pre-tilt stub holders

 

Introduction

Pre-tilt stub holders are useful for FIB/SEM systems to get the sample perpendicular with the FIB column to allow for straight FIB milling in to the surface  of the sample. The pre-tilt angles are complementary to the angles between the FIB column and the electron beam column. When pre-tilt stub holders are used, there is no need to tilt the sample stage. Three types are available:

  • EM-Tec P38 fixed 38° tilt holder for FEI pin stubs. Used to pre-tilt samples 38° for FEI Dual Beam FIB systems. Size w.o. pin is Ø12.7x17mm.
  • EM-Tec P36 fixed angle 36° tilt holder for Zeiss pin stubs. Used to pre-tilt samples 36° for Zeiss CrossBeam  FIB systems. Size w.o. pin is Ø12.7x17mm.
  • EM-Tec P35 fixed angle 35° tilt holder for standard and Tescan pin stubs. Used to pre-tilt samples 35° for Tescan FIBxSEM systems. Size w.o. pin is Ø12.7x17mm.
   Example
EM-Tec P38 fixed 36°pre-tilt holder for FEI FIB systems, Ø12.7x17mm, pin
     

 

Specifications of the EM-Tec pre-til stub holders

Product #

Style

Angle

FIB/SEM

Capacity

Size w/o pin

Stub holding method

AU-10-002238

P38

38°

FEI

Ø3.2mm pin

Ø12.7x17mm

Set screw

AU-10-002236

P36

36°

Zeiss

Ø3.2mm pin

Ø12.7x17mm

Set screw

AU-10-002235

P35

35°

Tescan

Ø3.2mm pin

Ø12.7x17mm

Set screw

3 Item(s)

3 Item(s)