Gripping stub & stub vises

EM-Tec gripping stub and stub based vise holders

Order pin stub based   |   Order Hitachi M4 stub based   |   Order JEOL cylinder stub based

Introduction

The EM-Tec gripping stub and stub based vise holders are useful to grip and hold SEM samples without much need for sample preparation. Ideal for cross-section and edge-on imaging. The comprehensive selection of this type of cost-effective gripping and vise type holders is compatible with  SEMs using pin stubs (FEI, Zeiss, Tescan, Phenom, Aspex), SEMs using M4 thread (Hitachi and EM-Tec SEM stage adapters) and JEOL SEMs.

 

Overview of the EM-Tec gripping stub and stub based vise holders

 

EM-Tec PHF32 filter holder kit for Phenom metallurgical sample holder EM-Tec PS4 mini pin stub vise clamp 0-4mm, Ø12.7x7.2mm, pin EM-Tec PS6 mini split pin stub vise clamp 0-6mm, Ø12.7x7.2mm, pin EM-Tec PS7 mini pin stub dual slot vise clamp, 2x1mm, Ø15x6mm, pin

AU-12-000234
GS24 gripping stub, pin

AU-10-002240
PS4 mini pin stub vise

AU-10-002218
PS6 mini pin split vise

AU-10-002242
PS7 mini dual slot vise

EM-Tec PS12 pin stub vise clamp 0-12mm, Ø25x7.2mm, pin
12-000334 EM-Tec GS24 gripping stub holder with clamping plate, 0-4mm, aluminium, M4
EM-Tec HS6 mini M4 cylinder stub vise clamp 0-6mm, Ø15x10mm, M4 EM-Tec HS15 M4 cylinder stub vise clamp 0-16mm, Ø25x10mm, M4

AU-12-000112
PS12 pin stub vise clamp

AU-12-000334
GS24 gripping stub, M4

AU-12-000306
HS6 mini M4 stub vise

AU-12-000315
HS15 stub vise clamp, m4

EM-Tec HS7 mini M4 cylinder stub dual slot vise clamp, 2x1mm, Ø15x6mm, M4 EM-Tec JS4 mini cylinder stub vise clamp 0-4mm, JEOL  Ø12.2x10mm EM-Tec JS12 cylinder stub vise clamp 0-12mm, JEOL  Ø25x10mm  

AU-12-000328
HS7 mini dual slot vise, M4

AU-12-000504
JS4 mini JEOL stub vise

AU-12-000512
JS12 JEOL stub vise clamp

 

 

EM-Tec pin stub compatible gripping stub and stub based vise holders:

  • EM-Tec GS24 gripping stub holder with clamping plate to hold samples or tissue up to 4mm thick.  Sample is held by the clamping plate which is pushed with set screws. Also useful for holding tissue for dehydration and CDP processing.  Holder size is 24x13x12mm; fits in any SEM using standard 3.2mm pin stubs. Ref: McTurk, G., Bulman, S., Ocklefors, C.C. Journal of microscopy 127,233. 1982.
  • EM-Tec PS4 mini pin stub vise clamp for sample thickness from 0-4mm. The sample is held vertically with a       small set screw.  Most effective way to study cross section of thin samples. Holder size w/o pin is Ø12.7x7.2mm.
  • EM-Tec PS6 mini pin stub split vise clamp for sample thickness from 0-6mm. The sample is clamped between the two min vise clamps. The split vise jaws are closed by an allen screw. Closed split vise diameter is 12.7mm; when opened it is 19x12.7mm.
  • EM-Tec PS7 mini pin stub dual slot vise with two slots of one mm wide. Ideal for holding thin wafer pieces samples for cross section imaging. Samples are clamped by set screws. Holder size w/o pin is Ø15x6mm.
  • EM-Tec PS12 pin stub vise clamp for sample thickness from 0-12mm. The sample is held vertically with a set screw.  Most effective way to study cross section of thin samples. Holder size w/o pin is Ø25x6mm.



EM-Tec gripping stub and stub based vise holders with M4 thread:

  • EM-Tec GS24 gripping stub holder with clamping plate to hold samples or tissue up to 4mm thick.  Sample is held by the clamping plate which is pushed with set screws. Also useful for holding tissue for dehydration and CDP processing.  Holder size is 24x13x12mm; M4 threaded hole in base. Ref: McTurk, G., Bulman, S., Ocklefors, C.C. Journal of microscopy 127,233. 1982.
  • EM-Tec HS6 mini M4 cylinder stub vise clamp for sample thickness from 0-6mm. The sample is held vertically with a small set screw.  Simple and cost-effective way to clamp cross section of thin samples. Holder stub size is Ø15x10mm xM4.
  • EM-Tec HS15 M4 cylinder stub vise clamp for sample thickness from 0-16mm. The sample is held vertically with a set screw (multiple lengths are supplied). Cost effective and practical small vise clamp base on the stub size of Ø25x10mm xM4.
  • EM-Tec HS7 mini pin stub dual slot vise with two slots of one mm wide. Ideal for holding thin wafer like samples for cross section imaging. Sample are clamped by set screws. Holder size w/o pin is Ø15x6mm.



EM-Tec JEOL stub based vise holders:

  • EM-Tec  JS4 mini cylinder stub vise clamp for sample thickness from 0-4mm. The sample is held vertically with a small set screw.  Most effective way to study cross section of thin samples. Holder stub size is Ø12.2x10mm.
  • EM-Tec JS12 cylinder stub vise clamp for sample thickness from 0-12mm. The sample is held vertically with a set screw (multiple lengths are supplied). Cost effective and practical small vise clamp based on the stub size of Ø25x10mm.

 

Capacity and dimensions of the EM-Tec gripping stub and stub based vise holders

Product #

Type

Capacity

Dimensions w/o pin

Securing methode

SEM stage compatibility

AU-12-000234

EM-Tec GS24

24x7x4mm

24x13x12mm

Screw + plate

Standard 3.2mm pin

AU-10-002240

EM-Tec PS4

0-4mm

Ø12.7x7.2mm

Set screw

Standard 3.2mm pin

AU-10-002218

EM-Tec PS6

0-6mm

Ø12.7x7.2mm

Set screw

Standard 3.2mm pin

AU-10-002242

EM-Tec PS7

2x1mm

Ø15x6mm

Set screw

Standard 3.2mm pin

AU-12-000112

EM-Tec PS12

0-12mm

Ø25x7.2mm

Set screw

Standard 3.2mm pin

AU-12-000334

EM-Tec GS24

24x7x4mm

24x13x12mm

Screw + plate

M4 thread

AU-12-000306

EM-Tec HS6

0-6mm

Ø15x10mm

Set screw

M4 thread

AU-12-000315

EM-Tec HS15

0-16mm

Ø25x10mm

Set screw

M4 thread

AU-12-000328

EM-Tec HS7

2x1mm

Ø15x6mm

Set screw

M4 thread

AU-12-000504

EM-Tec JS4

0-4mm

Ø12.2x10mm

Set screw

JEOL 12.2mm

AU-12-000512

EM-Tec JS12

0-12mm

Ø25x10mm

Set screw

JEOL 25mm

Ordering Information for EM-Tec gripping stub and stub based vise holders with standard 3.2mm pin

4 Item(s)

4 Item(s)