Phenom basic SEM sample preparation supplies

Introduction

In addition to the SEM mounts and holders for the Phenom SEMs, basic SEM sample preparation supplies are indispensable for optimum sample preparation and correct imaging and analysis. They are conveniently presented together on this page. Although the Phenom table top SEMs include operation to avoid charging it is good practice to work with conductive samples and to make sure that the samples are grounded by using conductive adhesives. It is recommended to coat the surface of non-conductive sample with a thin layer of gold, using a sputter coater. When using images to generate data for measurements, it is recommended to calibrate to the system the system first with an EM-Tec magnification calibration standard.

Basic sample preparation supplies

The folowing recommended basic SEM sample preparation supplies for the Phenom can be conveniently ordered from this page. Additional information can be found on the relevant product pages.

• EM-Tec conductive silver paste or carbon paint to glue sample to sample stubs   |  Product page
• EM-Tec conductive copper SEM tape to make grounding paths   |  Product page
• EM-Tec Silicon finder grid for either multiple small samples or correlative microscopy    |  Product page
• Conductive tabs to adhere samples such as powder on sample stubs   |  Product page
• EM-Tec stub gripper tweezers for the Ø12.7, Ø19 and Ø25.4mm SEM sample stubs   |  Product page
• EM-tec pin stub high capacity storage boxes for 28 and 153 pin stubs   |  Product page
• EM-Tec preparation pod for pin stubs   |  Product page
• Value-Tec sample preparation tweezers   |  Product page
• Value-Tec dust blower   |  Product page
• Micro-Tec disposable scalpels   |  Product page
• Micro-Tec white PE PrepBoard   |  Product page
• Micro-Tec fine needlesor preparing smaller samples   |  Product page
• Micro-Tec fine probes for preparing smaller samples   |  Product page

Calibration tools for the Phenom table top SEMs

Recommended calibration tools for imaging and EDX analysis with the Phenom table top SEM are:

• EM-Tec MCS-1TR magnification calibration standard on pin stub     #AU-31-T31000-1  |  Product page
• Micro-Tec MTC-5 multiple target graticule calibration standard     #AU-31-T33600-3  |  Product page
• EM-Tec CSX-5C light element and EDX calibration standard     #AU-36-000505  |  Product page